SCANNING PROBE MICROSCOPY / PRODUCTS


ULTRAObjective™

The ideal combination of light- and scanning probe microscopy. Combine the benefits of simple sample handling, the high optical quality of our microscopes and their wide variety of contrasting types with the new imaging mechanisms of scanning probe microscopy at an extremely high resolution.

Manufacturer: Surface Imaging Systems GmbH
Resolution: in X-Y-Z: < 1 nm="" />
Scanner: Single-tube scanner with integrated probe tip mount and deflection detection, scanner linearization by wire strain gauge system
Scan width (image field): max. 30 µm x 30 µm (vertical approx. 2 µm)
Probe tips: all commercially available tips can be used; premounted on a plug connector
Operating modes: Contact AFM as a standard feature; optional: MFM, LFM, non-contact AFM (further modes in preparation)
Software: Windows software for data acquisition, image evaluation and processing; option of additional image processing
Microscopes: All sturdy Zeiss stands, e.g. Axioskop, Axioplan or Axiotron
Size: Ø 38 mm, length 50 mm, W 0,8 thread (matched to focal length)

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Surface Imaging Systems GmbH
Innovations in scanning probe microscopy

Surface Imaging Systems GmbH
Kaiserstraße 100
Herzogenrath
Tel: +49 2407 96 147
Fax: +49 2407 96 275
E-Mail: [email protected]