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SCANNING PROBE MICROSCOPY / PRODUCTS | |
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| Beetle™ UHV-SPM Combined AFM-STM for UHV-applications. Further development of the famous Beetle-STM from Besocke Delta Phi GmbH. | |
| Scanner resolution: | lateral <1 Å, vertical="">< /> max. scan width: 3 µm max. z-range: 0,5 µm |
| Samples: | max. sample size: up to 4 max. sample weight: 30 g |
| manipulation: | llateral single step 20 Å - 1 µm over 20 mm² vertical single step 5 Å - 200 Å over 0.5 mm |
| UHV connection requirements: | flange: Conflat 2 ¾ outer dia flange/sample distance: 60 mm |
| Temperature range: | bakeable up to 180 °C sample temperature possible from 4 K to 900 K |
| Exchangeable probes for STM: | 0.25 mm wire tips |
| Exchangeable probes for AFM: | oscillator crystal sensor equipped with different probes |
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Homepage |
Business Group
If you have any suggestions and/or requests please contact
[email protected].
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Besocke Delta Phi GmbH Inventor of the Beetle principle for scanning tunneling microscopy | |
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Besocke Delta Phi GmbH Auf der Tuchbleiche 8 D-52428 Jülich Fax: +49 2461 56025 | |