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MICROSCOPES FOR THE MICROELECTRONICS INDUSTRY / ACCESSORIES | |
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The ULTRAObjective
Microscopy far below the diffraction limit
A new objective is now opening up new
horizons in microscopy. It permits the ideal combination of classical
light microscopy and top-resolution scanning microscopy.
With the ULTRAObjective
from
Surface Imaging Systems GmbH, Herzogenrath, Carl Zeiss has
introduced a means of permitting the integrated and extremely
convenient solution of widely varying, separate problems. The
resolution capability of the light microscope has been extended
down to a resolution of 1 nanometer. Micro- and nanostructures
can be characterized qualitatively and quantitatively.
Classical microscopy with its high operating
convenience and productivity has now been extended by new types
of contrast, such as topography, magnetic and potential contrast.
It is possible not only to obtain images
of extremely high resolution, but also to perform measurements
in a very easy way. Applications range from new materials to microbiological,
magnetic and semiconductor structures.
Depending on the application, the ULTRAObjective
can be combined with different microscopes from Carl Zeiss. Particularly
efficient configurations are possible with the new
Axioplan 2
and
Axiophot 2 research microscopes recently launched.
The objective is screwed into the nosepiece
and thus integrated into the light microscope system. The interesting
sections of the object are easily and conveniently relocated and
can then be examined in detail using the ULTRAObjective.
Digital photomicrography or spectroscopy
permits an extremely large variety of object characterizations
to be performed, covering six orders of magnitude from the millimeter
to the nanometer.
ULTRAObjective extends light microscopy
by new, non-optical types of contrast, such as topography, magnetic
and potential contrast.
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