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/31/ Grunewald, U., Saurenbach F., Böcking, A.: Aspects of Combining Light and Scanning Probe Microscopy; Scanning, Vol. 18, 158-159 (1996)
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/30/ Dürselen, R.: Investigation of artefact-based AFM-calibration for z-direction; PTB-Berichte 1995, in press
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| /29/ Grunewald, U., Bartzke, K., Antrack, T.: Application of the needle sensor for microstructure measurements and atomic force microscopy; Thin Solid Films 264 (1995) 169-171
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| /28/ Dürselen, R., Grunewald, U., Preuß>, W.: Calibration and Application of High Precision Piezoscanner for Nanometrology; Scanning, Vol. 17, 91-96 (1995)
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| /27/ Frank, N.; Springholz, G.; Bauer, G.: Surface evolution during MBE growth of EuTe studied by UHV-STM and RHEED investigations; Mat. Res. Soc. Symp. Proc. Vol. 317, 1994
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| /26/ Frank, N.; Springholz, G.; Bauer, G.: Strain induced slanting of EuTe epitaxial films observed by in-situ-RHEED and STM investigations; Material Science Forum vols. 143-147 (1994) pp. 1623-1628
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| /25/ Frank, N.; Springholz, G.; Bauer, G.: Imaging of Misfit Dislocation Formation in Strained Layer Heteroepitatxy by Ultrahigh Vacuum Scanning Tunneling Microscopy; Physical Review Letters Volume 73, Nimber 16, 17 October 1994
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| /24/ Springholz, G.; Frank, N.; Bauer, G.: Surface roughening transition and critical layer thickness in strained-layer heteroepitaxy of EuTe on PbTe(111); Appl. Phys. Lett 64 (22), 30 May 1994
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| /23/ Palm, H.: Emission ballistischer Ladungsträger über Schottky-Barrieren; Dissertation Naturwissenschaftliche Fakultäten der Universität Erlangen-Nürnberg, Juni 1994
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| /22/ Szot, K.; Keppels, J.; Speier, W.; Besocke, K.; Teske, M.; Eberhardt, W.: Surface Chemistry and Molecular Reactions on KNbO3 Single Crystal Surfaces: to be published in Appl. surface sci. 1994
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| /21/ Mirandé W.; Geuther, H.; Schröder K. P.: AFM profilometry at micro-structure edges in support of high accuracy optical metrology; Proceedings of the "Optical Metrology and Nanotechnology"; Engelberg, Switzerland; March 27-30, 1994
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| /20/ Bartzke, K.; Antrack, T.: Atomic Force Sensor with quartz oscillator and tip; Proceedings of the "Optical Metrology and Nanotechnology"; Engelberg, Switzerland; March 27-30, 1994
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| /19/ Palm, H., Arbes, M., Schulz, M.: Fluctuations of the Au-Si(100) Schottky Barrier Height; Physical Review Letters, Vol. 71, Nb. 14, Oct. 1993
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| /18/ Seidel, Ch.: Charakterisierung organischer Adsorbate auf Silbereinkristallen mit den Meßmethoden LEED und STM; Dissertation Physikalisches Institut der Universität Stuttgart, Juli 1993
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| /17/ Reay, N. K.: Sub-nanometre precision closed-loop positioning for optics and X-Y stage control unsing capacitance displacement sensors and piezo-electric actuators; SPIE, 1993, Vol. 2088, 150-159
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| /16/ Bartzke K., Antrack, T., Schmidt, K.H., Dammann, E., Schatterny, CH.: The needle sensor - a micromechanical detector for atomic force microscopy; International Journal of Optoelectronics, 1993, Vol. 8
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| /15/ Rossel, C.; Besocke, K.; Schulz, R.: Etching of the surface of High-Tc Superconductors with an STM Tip; Proceedings of the Swiss Physical Society, Fall meeting 1992
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| /14/ Haiss, W. Sass, J.K.; Gao, X.; Weaver, M.J.: Iodine Adlayer Structures on Au(111) as Discerned by Atomic-Resolution Scanning Tunneling Microscopy: Relation to Iodide Electrochemical Adsorbtion, Scientific Report 1992
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| /13/ Niehus, H.: Ion scattering spectroscopy and scanning tunneling microscopy: a powerful combination for surface structure analysis: Appl. Phys. A 53 (1991)
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| /12/ Haiss, W.; Lackey, D.; Sass, J.K.; Besocke, K.: Atomic resolution scanning tunneling microscopy images of Au(111) surfaces in air and polar organic solvents; J. Chem. Phys. 95 (3), August 1991
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| /11/ Sass, J.K.; Gimzewski, J.K., Haiss, W.; Besocke, K.; Lackey, D.:Dynamic Aspects of Electron Tunneling through Polar Liquids and Atomic Resolution STM Images of Au(111)/Organic Solvant Interfaces: IBM Research Report #74747, June 1991
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| /10/ Niehus, H.; Spitzel, R., Besocke, K.; Comsa, G.: N-induced (2x3) reconstruction of Cu(110): Evidence for long-range, highly directional interaction between Cu-N-Cu bonds; Physical Review B, Vol. 43 Nb. 15, May 1991
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| /9/ Schummers, A.; Halling, H.; Besocke, K.; Cox, G.: Controls and software for tunneling spectroscopy: J. Vac. Sci. Technol. B9(2), Apr. 1991
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| /8/ Michely, T.; Besocke, K.; Comsa, G.: Observation of sputtering damage on Au(111): Surface Science Letters 230 (1990)
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| /7/ Frohn, J.; Wolf, J.F.; Besocke, K.; Teske, M.: Coarse tip distance adjustment and positioer for a scanning tunneling microscope: Rev. Sci. Instrum. 60(6), June 1990
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| /6/ Niehus, H.; Raunau, W.; Besocke, K.; Spitzel, R.; Comsa, C.: Surface Structure of NiAl(111) Determined by ion scattering and scanning tunneling microscopy; Surface Science Letters 225 (1990)
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| /5/ Butz, R.; Wagner, H.; Besocke, K.: Equipment of a 3-inch silicon molecular beam epitaxial system with scanning tunneling microscopy; Thin Solid Films, 183 (1989)
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| /4/ Frohn, J.; Linke, U.; Besocke, K.: Thermal Etching of Platinum Crystals in Air, Hydrogen and Oxygen - Some STM Observations: Pract. Met. 26 (1989)
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| /3/ Michely, T.; Besocke, K.; Teske, M.: A combined scanning tunneling and field ion microscope: Journal of Microscopy, Vol. 152, Oct. 1988
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| /2/ Besocke, K.; Teske, M.; Frohn, J.: Investigation of silicon in air with a fast scanning tunneling microscope; J. Vac. Sci. Technol. A6(2), Apr. 1988
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| /1/ Besocke, K.: An easily operable scanning tunneling microscope: Surface Science 181 (1987)
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